Inspection Technology for SMT.

Wafer Inspection Technology Challenges for ULSI Manufacturing

The use of wafer inspection systems in managing semiconductor manufacturing yields is described. These systems now detect defects of size as small as 40 nm. Some high-speed systems have achieved 200-mm diameter wafer throughputs of 150 wafers per hour. The particular technologies involved are presented. Extensions of these technologies to meet the requirements of manufacturing integrated circui...

Technology for Robotic Surface Inspection in Space

This paper presents on-going research in robotic inspection of space platforms. Three main areas of investigation are discussed: machine-vision inspection techniques, an integrated sensor end-e ector, and an orbital environment laboratory simulation. Machine-vision inspection utilizes automatic comparison of new and reference images to detect on-orbit induced damage such as micro-meteorite impa...

Automation Technology for Fabric Inspection System

Using Technology to Support Aircraft Inspection Training

Research in aircraft inspection and maintenance has revealed the criticality of human inspection performance in improving aviation safety. If we are to provide the general public with a safe and reliable air transportation system, inspection must be performed effectively, efficiently and consistently. Even though it is difficult to eliminate errors completely, continuing emphasis must be placed...

In-Line Inspection using Ultrasonic Technology

Ultrasonic (UT) is currently the most accurate and reliable In-Line Inspection (ILI) technology available in the market. These UT ILI Tools will record data while travelling through the pipeline from Launcher to Receiver. In most cases, the Pipeline Operator does not need to make major adjustments to their pipeline's normal operating conditions when conducting the inspection survey. Piezo-elect...